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RT9161A-50PG Suppliers,Datasheet of RT9161A-50PG

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16. Test mode operation specified in this data sheet is 2-bit test function controlled by control address bits - - - CAO. This test mode operation can be performed by WE and-CAS-before-RAS (WCBR) refresh cycle. Refresh during test mode operation will be performed by normal read cycles or by WCBR refresh cycles. When the state of two test bits accord each other, the condition of the output data is low level. In order to end this test mode operation, perform a RAS only refresh cycle or a CAS-before-RAS refresh cycle.
RT9161A-50PG Datasheet

Note (1) : CPD is defined as the value of the internal equivalent capacitance which is calculated from the operating current consumption without load. Average operating current can be obtained by the equation : ICC (opr) = CPD-VCC-fIN +ICC
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9. Operation with the tRAD(max) limit insures that tRAC(max) can be met, tRAD(max) is specified as a reference point only; if tRAD iS greater than the specified tRAD(max) limit, then access time is controlled exclusively by tAA.
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applications, without sacrificing switching speed.Break-before-make switching action is guaranteed, and anepitaxial layer prevents latchup. Single supply operation (forpositive switch voltages) is allowed by connecting the V- railt0 0 V.
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Constructed with the Intersil UHF2X-CMOS process, thesedevices have been specifically designed to provide highlyreliable performance in harsh radiation environments. Thisprocess has been tested for single event latch-up and hasdemonstrated an immunity t0 90MeV/mg/cm2.

RT9161A-50PG Suppliers, RT9161A-50PG Datasheet, RT9161A-50PG on stock, RT9161A-50PG price

RT9161A-50PG	MBN300F12	VI-JNZ-EX	X9241AUSI	C0603KRX7R9BB103	C68212Y	VI-B22-CU	HD74LS126AP
PAN101B0I-204	LDM300-48S5	6666AN103K1	IDT23S05-1HDCG8	SN74HC08ANSRE4	74HC132DBLE	HLMP-ED55-NKKDD	FDS6992